CON-2016-0404 10. FENÔMENOS NÃO-LINEARES E CAÓTICOS EM ENGENHARIA

Dynamic analysis of an atomic force microscopy (AFM) including fractional-order

Angelo Marcelo Tusset¹; Frederic Conrad Janzen¹; Vinícius Piccirillo¹; Jose Manoel Balthazar²; Rodrigo Tumolin Rocha³

¹ UTFPR; ² UNESP-ITA; ³ UNESP

doi:10.20906/CPS/CON-2016-0404

Resumo

In this work, the nonlinear dynamics of an Atomic Force Microscope micro cantilever operating in tapping mode is investigated, considering the influence of the damping, nonlinear stiffness term, and squeeze film damping in fractional-order. The response analysis of the system is done by bifurcation diagrams, phase portraits and Lyapunov exponents. Numerical results showed that the analyzed parameters play an important role can lead to different responses, like periodic and chaotic motion. In particular, for squeeze film damping in fractional-order, the results showed the influence of the order of the derivative on the dynamic (regular or non-periodic) behavior. To characterize these behaviors the 0-1 test was used since this is a good tool to characterize fractional-order differential systems.

Palavras-chave: Atomic Force Microscopy; Tapping Mode Vibration; Nonlinear Dynamics; Chaos; Fractional-Order; 0-1 Test

Como citar

Angelo Marcelo Tusset; Frederic Conrad Janzen; Vinícius Piccirillo; Jose Manoel Balthazar; Rodrigo Tumolin Rocha. “Dynamic analysis of an atomic force microscopy (AFM) including fractional-order”. IX Congresso Nacional de Engenharia Mecânica. CONEM2016. 2016. DOI: 10.20906/CPS/CON-2016-0404